LS ScanWave LSSW1000
Microwave near-field scanning imaging and NDT software system, current product
Product family: Precision Multi-Axis Scanning Platform
LS ScanWave LSSW1000
Professional microwave NDT software integrating precision multi-axis motion control and high-frequency reflection analysis for advanced coatings, aerospace composites, and electronic components.
Recommended scan step0.01 mm
Recommended scan points200,000
Data sizeLive estimator
Product Family
LS ScanWave System Composition
This page focuses on LS ScanWave LSSW1000 and explains how the software, scanning platform, VNA, probes, fixtures, and reporting workflow fit together as a complete system.
Precision multi-axis scanning platform
Provides planar or expanded multi-axis motion control for task planning by sample size and step resolution
Vector network analyzer
Acquires broadband S-parameters. Model and frequency range are selected by material, probe, and depth requirement
Microwave probes and fixtures
Near-field probes, positioning fixtures, or custom jigs are selected for repeatable positioning
Data processing and report module
Delivers defect quantification, data export, and project reporting workflows
Hardcore Solution
TBC and Absorbing Coating NDT
LS ScanWave LSSW1000 supports broadband microwave reflection scanning workflows for turbine blades, gas turbine hot-section parts, and functional coatings, helping evaluate ceramic layers, metal-substrate interfaces, and thin air-gap response.
- Supports equivalent dielectric constant inversion and porosity distribution mapping.
- Assists delamination air-gap thickness extraction and abnormal region contouring.
- Analyzes frequency-band consistency for absorbing materials and stealth coatings.
Applications
Application Matrix
Applications are organized by observable target, typical sample, and recommended configuration so materials, aerospace, electronics, and research users can quickly judge fit.
Aerospace thermal barrier coatings
- Target
- Ceramic porosity, interface delamination, thin air-gap response
- Typical samples
- Turbine blades, combustor hot-section parts, TBC coupons
- Recommended setup
- LS ScanWave LSSW1000 + Precision multi-axis scanner + broadband VNA
Radar absorbing materials and coatings
- Target
- Reflection response uniformity, coating thickness variation, band-specific anomalies
- Typical samples
- Absorbing coating panels, RAM samples, functional coating coupons
- Recommended setup
- LS ScanWave LSSW1000 + microwave probe + swept reflection measurement chain
Composite delamination and inclusions
- Target
- Interlayer delamination, inclusions, local dielectric anomalies
- Typical samples
- CFRP/GFRP panels, honeycomb sandwich structures, resin composites
- Recommended setup
- LS ScanWave LSSW1000 + planar scanning platform + reflection image analysis
PCB and electronic package layer anomalies
- Target
- Dielectric layer variation, interlayer voids, local package response differences
- Typical samples
- High-frequency PCB, package substrates, antenna dielectric boards, electronic modules
- Recommended setup
- LS ScanWave LSSW1000 + high-frequency VNA + fine-step precision scanning
Adhesive bond and interface debonding
- Target
- Bond-line voids, local debonding, adhesive layer nonuniformity
- Typical samples
- Bonded structures, sandwich assemblies, composite joints
- Recommended setup
- LS ScanWave LSSW1000 + S11 area scan + defect region quantification
Research-grade microwave scanning imaging
- Target
- Algorithm validation, S11 data acquisition, 2D/3D reconstruction experiments
- Typical samples
- University material samples, microwave devices, lab-developed structures
- Recommended setup
- LS ScanWave LSSW1000 + existing VNA/stage + external algorithm workflow
System Configuration
System Components and Typical Setup
LS ScanWave LSSW1000 is best delivered as the software and data-processing core of a scanning inspection system, evaluated together with scanner, VNA, probes, fixtures, and reporting workflow.
LS ScanWave LSSW1000 software
Runs S11 reflection scanning imaging, data caching, image processing, result export, and external algorithm workflows.
Precision multi-axis scanning platform
Provides planar or expanded multi-axis motion control for task planning by sample size and step resolution.
Vector network analyzer
Acquires broadband S11 reflection parameters. Model and frequency range are selected by material, probe, and depth requirement.
Microwave probe and fixtures
Near-field probes, positioning fixtures, or custom jigs are selected to keep repeatable positioning and stable lift-off.
Data processing and report module
Exports CSV, Excel, .MAT, etc. for defect quantification and project reporting.
Algorithms
Algorithms and Pre-processing
Frequency-domain amplitude/phase reconstruction
Maps amplitude, phase, real part, and imaginary part by selected frequency point or averaged frequency band with spatial phase unwrapping.
Precision Gated-TDR
Time-domain reflection analysis for broadband S11 data with window functions, zero-padding interpolation, and reflection peak localization.
B-Scan depth profile imaging
Provides X-Z and Y-Z cross-sectional views for more intuitive layer and interface inspection.
Lynshuo RMA-Focus
Performs 3D focusing for high-frequency microwave diffraction and reconstructs reflection scalar data volumes.
Adaptive lift-off phase compensation
Corrects phase distortion caused by probe motion jitter or sample surface unevenness.
Denoising and defect quantification
Supports wavelet threshold denoising, edge extraction, median filtering, and defect area/center/response reports.
Software Workflow
Interface and Data Workflow
- Real-time data monitoringDisplays current-point sweep amplitude, phase, and impedance response.
- Data-loss protectionRolling cache append keeps measured data available after an interrupted scan.
- Open export formatsSupports CSV, Excel, .MAT, etc. delivery.
- External algorithm workflowExternal algorithms or standalone executable workflows can be evaluated by project requirements.
Estimator
Interactive Scan Parameter Estimator
Use it to estimate scan points, scan duration, and data size during early feasibility discussion. Data size is estimated from uncompressed complex S11 data; actual files vary by export format, field structure, and precision settings.
Scan points40,401 points
Estimated scan time4 h 4 min
Complex S11 data estimate987.0 MB
Estimated as uncompressed complex128 S11 data. Actual CSV, Excel, .MAT, etc. files vary by field structure, precision, and compression settings.
Contact
Request LS ScanWave LSSW1000 Technical Brief and System Proposal
Include the sample material, existing VNA, existing motion stage, expected scan area, and required step resolution. An engineer will evaluate a practical configuration.