Keithley 2606B High-Density System SMU
面向高阶调试的专业级示波器
4 Channels通道
渠道分销
快速响应
推荐方案套装
面向 IV 表征的 SMU 配置。
IV 表征配置
高精度源测与合规控制。
适用场景： 半导体研发
关键参数
源输出范围合规限制脉冲宽度
- 主机（2606B）
- 三同轴线缆
- 探针台接口
- 脉冲 IV 选件
* 工程师将进行兼容性核查。
详细规格
2606B 的技术参考
| Channels | 4 Channels |
产品概览
High-density system SourceMeter (SMU) instrument providing four 20W SMU channels in a 1U high chassis
Quad channel SMU with 3A maximum current sourcing/ranging capability per channel
20V maximum voltage sourcing/ranging per channel for versatile testing applications
Ultra-high measurement resolution: 100fA current / 100nV voltage per channel
20W maximum power output per channel for comprehensive device characterization
3x density improvement over traditional SMU solutions
Optimizes footprint and reduces test time and costs for manufacturers
Improves throughput while minimizing the need for additional test equipment racks
Ideal solution for production testing of laser diodes, LEDs, and 2- and 3-terminal semiconductors
TSP® technology runs complete test programs for automated system applications
TSP-Link® technology allows daisy-chaining for high-volume parallel testing
Advanced triggering and sweep capabilities for multi-channel measurements
Precision IV characterization and parametric testing across four channels
Automated production testing environments with space optimization
Laser diode and LED production testing and validation
2- and 3-terminal semiconductor device testing
Multi-channel electronic component characterization
High-density research and development applications
High-volume parallel testing systems with space constraints
Comprehensive multi-channel data logging and analysis
SCPI and TSP programming support for multi-channel automation
Multiple connectivity options for high-density system integration
Compact 1U rack-mountable design for maximum space efficiency
High-resolution display for multi-channel measurement monitoring
Quick start guide for multi-channel operation
Power cord
Multi-channel test leads (4 sets)
USB cable
TSP multi-channel software package
Quad channel SMU with 3A maximum current sourcing/ranging capability per channel
20V maximum voltage sourcing/ranging per channel for versatile testing applications
Ultra-high measurement resolution: 100fA current / 100nV voltage per channel
20W maximum power output per channel for comprehensive device characterization
3x density improvement over traditional SMU solutions
Optimizes footprint and reduces test time and costs for manufacturers
Improves throughput while minimizing the need for additional test equipment racks
Ideal solution for production testing of laser diodes, LEDs, and 2- and 3-terminal semiconductors
TSP® technology runs complete test programs for automated system applications
TSP-Link® technology allows daisy-chaining for high-volume parallel testing
Advanced triggering and sweep capabilities for multi-channel measurements
Precision IV characterization and parametric testing across four channels
Automated production testing environments with space optimization
Laser diode and LED production testing and validation
2- and 3-terminal semiconductor device testing
Multi-channel electronic component characterization
High-density research and development applications
High-volume parallel testing systems with space constraints
Comprehensive multi-channel data logging and analysis
SCPI and TSP programming support for multi-channel automation
Multiple connectivity options for high-density system integration
Compact 1U rack-mountable design for maximum space efficiency
High-resolution display for multi-channel measurement monitoring
Quick start guide for multi-channel operation
Power cord
Multi-channel test leads (4 sets)
USB cable
TSP multi-channel software package
面向最新接口标准的设计与调试，Keithley 2606B High-Density System SMU 提供行业领先的精度与信号完整性。