Keithley 2601B System SMU
面向高阶调试的专业级示波器
渠道分销
快速响应
推荐方案套装
面向 IV 表征的 SMU 配置。
IV 表征配置
高精度源测与合规控制。
适用场景： 半导体研发
关键参数
源输出范围合规限制脉冲宽度
- 主机（2601B）
- 三同轴线缆
- 探针台接口
- 脉冲 IV 选件
* 工程师将进行兼容性核查。
详细规格
2601B 的技术参考
产品概览
Industry-standard current-voltage source and measurement solution for highly automated production test applications
Single channel SMU with 10A maximum current sourcing/ranging capability
40V maximum voltage sourcing/ranging for versatile testing applications
Ultra-high measurement resolution: 100fA current / 100nV voltage
200W maximum power output for comprehensive device characterization
Tightly integrated precision power supply, true current source, digital multimeter, and electronic load
TSP® technology runs complete test programs for automated system applications
TSP-Link® technology allows daisy-chaining up to 64 channels for high-volume parallel testing
Pulse generation capability for advanced testing scenarios
Precision IV characterization and parametric testing
Automated production testing environments
Semiconductor device testing and validation
Electronic component characterization
Research and development applications
High-volume parallel testing systems
Advanced triggering and sweep capabilities
Comprehensive data logging and analysis
SCPI and TSP programming support for automation
Multiple connectivity options for system integration
Compact rack-mountable design
High-resolution display for measurement monitoring
Quick start guide
Power cord
Test leads
USB cable
TSP software package
Single channel SMU with 10A maximum current sourcing/ranging capability
40V maximum voltage sourcing/ranging for versatile testing applications
Ultra-high measurement resolution: 100fA current / 100nV voltage
200W maximum power output for comprehensive device characterization
Tightly integrated precision power supply, true current source, digital multimeter, and electronic load
TSP® technology runs complete test programs for automated system applications
TSP-Link® technology allows daisy-chaining up to 64 channels for high-volume parallel testing
Pulse generation capability for advanced testing scenarios
Precision IV characterization and parametric testing
Automated production testing environments
Semiconductor device testing and validation
Electronic component characterization
Research and development applications
High-volume parallel testing systems
Advanced triggering and sweep capabilities
Comprehensive data logging and analysis
SCPI and TSP programming support for automation
Multiple connectivity options for system integration
Compact rack-mountable design
High-resolution display for measurement monitoring
Quick start guide
Power cord
Test leads
USB cable
TSP software package
面向最新接口标准的设计与调试，Keithley 2601B System SMU 提供行业领先的精度与信号完整性。