Semiconductor Testing
Precision measurement for IC development and production
Overview
Advanced test solutions for semiconductor device characterization, wafer-level testing, and production verification. From research to high-volume manufacturing.
Industry Challenges
Sub-femtoamp current measurements
High-speed digital interface testing
RF/mmWave IC characterization
Wafer-level and package-level testing
High-throughput production requirements
Our Capabilities
Parametric Testing
DC and CV characterization of semiconductor devices
RF IC Testing
S-parameter and large-signal measurements for RF devices
High-Speed Digital
SerDes, DDR, and high-speed interface validation
Reliability Testing
HTOL, ESD, and reliability screening
Recommended Products
Keysight B2900B Series
Precision SMU for device characterization
View Products →Keysight N5227B PNA
Network analyzer for on-wafer measurements
View Products →Keysight UXR Series
High-bandwidth scope for SerDes testing
View Products →Keysight M8190A
Arbitrary waveform generator
View Products →Key Applications
Ready to Get Started?
Contact our application engineers to discuss your semiconductor testing requirements.