N7700210C Wafer Probe Station TAP Insert
Professional Grade Oscilloscope for Advanced Debugging
Recommended Solution Packages
Software bundles tailored to analysis and automation.
Analysis Suite
Unified offline analysis with multi-instrument support.
- Base license
- Multi-instrument connectivity
- Offline analysis option
- Maintenance plan
* Includes compatibility check by our engineers.
Detailed Specifications
Technical Reference for N7700210C
Product Overview
Photoelectric probe positioning and alignment test steps
Supports array/single fiber probes, edge and surface coupling, RF/DC probes and flexible probe orientation (east/west/north/south)
Automated device stepping and probe station status control
Measurement test plan and device data management (import/export/edit of device coordinates, device component parameters and test conditions)
For engineers designing and debugging the latest interface standards, the N7700210C Wafer Probe Station TAP Insert offers the highest accuracy and signal integrity in the industry.
Why Choose Lynshuo?
Certified Quality
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Expert Support
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